Power Semiconductor Junction Temperature and Lifetime Estimations: A Review
The lifetime of power electronic systems is the focus of both the academic and industrial worlds. Today, compact systems present high switching frequency and power dissipation density, causing high junction temperatures and strong thermal fluctuations that affect their performance and lifetime. This...
| 出版年: | Energies |
|---|---|
| 主要な著者: | , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
MDPI AG
2024-09-01
|
| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/1996-1073/17/18/4589 |