Scanning probe microscopy applied to the study of domains and domain walls in a ferroelectric KNbO₃ crystal

A commercial Atomic Force Microscope (AFM) and a semi-home made Scanning Near-Field Optical Microscope (SNOM) have been used to characterize electrically, topographically and optically the domain walls among natural ferroelectric domains in a KNbO3 crystal. The AFM measurements have been performed w...

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Bibliographic Details

Published in:	Boletín de la Sociedad Española de Cerámica y Vidrio
Main Authors:	Martínez-Pastor, J., Valdés, J. L., Martín-Carrón, L., Canet-Ferrer, J.
Format:	Article
Language:	English
Published:	Elsevier 2006-06-01
Subjects:	KNbO3 ferroelectric domain-wall SNOM and AFM ferroeléctrico pared de dominio SNOM y AFM
Online Access:	http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/309/328