Symmetric mean and directional contour pattern for texture classification

Abstract In this letter, we propose a simple yet effective texture descriptor, symmetric mean and directional contour pattern (SMDCP), for texture classification. In particular, first the robust symmetric mean pattern (RSMP) that extracts the sign and amplitude information of the local difference th...

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Bibliographic Details

Published in:	Electronics Letters
Main Authors:	Yongsheng Dong, Boshi Zheng, Hong Liu, Zhiyong Zhang, Zhumu Fu
Format:	Article
Language:	English
Published:	Wiley 2021-11-01
Subjects:	Other topics in statistics Image recognition Computer vision and image processing techniques
Online Access:	https://doi.org/10.1049/ell2.12310