Blockchain Assisted Data Edge Verification With Consensus Algorithm for Machine Learning Assisted IoT

Internet of Things (IoT) devices are becoming increasingly ubiquitous in daily life. They are utilized in various sectors like healthcare, manufacturing, and transportation. The main challenges related to IoT devices are the potential for faults to occur and their reliability. In classical IoT fault...

Full description

Bibliographic Details
Published in:IEEE Access
Main Authors: Thavavel Vaiyapuri, K. Shankar, Surendran Rajendran, Sachin Kumar, Srijana Acharya, Hyunil Kim
Format: Article
Language:English
Published: IEEE 2023-01-01
Subjects:
Blockchain
Internet of Things
consensus algorithm
fault detection
deep learning
hyperparameter tuning
Online Access:https://ieeexplore.ieee.org/document/10138178/

Internet

https://ieeexplore.ieee.org/document/10138178/

Similar Items