APA (7th ed.) Citation

Wan, Q., & Zhang, H. (2022, January). A Novel Fault Identification Method Driven by Knowledge and Data. IEEE Access.

Chicago Style (17th ed.) Citation

Wan, Qihao, and Heming Zhang. "A Novel Fault Identification Method Driven by Knowledge and Data." IEEE Access Jan. 2022.

MLA (9th ed.) Citation

Wan, Qihao, and Heming Zhang. "A Novel Fault Identification Method Driven by Knowledge and Data." IEEE Access, Jan. 2022.