A Novel Fault Identification Method Driven by Knowledge and Data
In the field of intelligent manufacturing, fault identification is an effective way to improve product service by identifying the cause of failures. For addressing it, the Generalized Bayesian Network (GBN) model is extended based on the traditional Bayesian Network in this paper, which redefines th...
| Published in: | IEEE Access |
|---|---|
| Main Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
|
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9754576/ |