Thickness measurement of multilayer film stack in perovskite solar cell using spectroscopic ellipsometry

The rapid surge in perovskite solar cell efficiency has necessitated the development of viable metrology techniques during device integration, paving the way for commercialization. Ellipsometry is considered the most appropriate technique for fast and accurate thickness measurement for large scale p...

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Bibliographic Details

Published in:	AIP Advances
Main Authors:	Mehedhi Hasan, Kevin Lyon, Lauren Trombley, Casey Smith, Alex Zakhidov
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2019-12-01
Online Access:	http://dx.doi.org/10.1063/1.5125686