Incremental Learning in Modelling Process Analysis Technology (PAT)—An Important Tool in the Measuring and Control Circuit on the Way to the Smart Factory

To meet the demands of the chemical and pharmaceutical process industry for a combination of high measurement accuracy, product selectivity, and low cost of ownership, the existing measurement and evaluation methods have to be further developed. This paper demonstrates the attempt to combine future...

Full description

Bibliographic Details

Published in:	Sensors
Main Authors:	Shivani Choudhary, Deborah Herdt, Erik Spoor, José Fernando García Molina, Marcel Nachtmann, Matthias Rädle
Format:	Article
Language:	English
Published:	MDPI AG 2021-05-01
Subjects:	SVM incremental learning Raman spectroscopy process technology
Online Access:	https://www.mdpi.com/1424-8220/21/9/3144