Imperfect Wheat Grain Recognition Combined with an Attention Mechanism and Residual Network

Intelligent detection of imperfect wheat grains based on machine vision is of great significance to correctly and rapidly evaluate wheat quality. There is little difference between the partial characteristics of imperfect and perfect wheat grains, which is a key factor limiting the classification an...

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Bibliographic Details

Published in:	Applied Sciences
Main Authors:	Weiwei Zhang, Huimin Ma, Xiaohong Li, Xiaoli Liu, Jun Jiao, Pengfei Zhang, Lichuan Gu, Qi Wang, Wenxia Bao, Shengnan Cao
Format:	Article
Language:	English
Published:	MDPI AG 2021-06-01
Subjects:	imperfect wheat grains machine version residual network attention mechanism
Online Access:	https://www.mdpi.com/2076-3417/11/11/5139