Simulation and Performance Analysis of 32 nm FinFet based 4-Bit Carry Look Adder

FinFET at 32 nm and beyond is an emerging transistor technology offer interesting delay–power tradeoff. FinFETs are a necessary step in the evolution of semiconductors because bulk CMOS has difficulties in scaling beyond 32 nm. Use of the back gate leads to very interesting design opportunities....

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Bibliographic Details
Published in:Журнал нано- та електронної фізики
Main Authors: S. Rashid, S. Khan, A. Singh
Format: Article
Language:English
Published: Sumy State University 2017-10-01
Subjects:
Online Access:http://jnep.sumdu.edu.ua:8080/download/numbers/2017/5/articles/Proof_JNEP_05003.pdf