An Explainable Deep Learning Network With Transformer and Custom CNN for Bean Leaf Disease Classification

Bean rust and angular leaf spot pose significant challenges to bean cultivation, impacting yields. Prompt disease identification maximizes productivity, but traditional methods need specialized expertise. This research presents an explainable deep learning model that combines the Pyramid Vision Tran...

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書目詳細資料
發表在:IEEE Access
Main Authors: R. Karthik, R. Aswin, K. S. Geetha, K. Suganthi
格式: Article
語言:英语
出版: IEEE 2025-01-01
主題:
在線閱讀:https://ieeexplore.ieee.org/document/10904208/