A combination of joint linkage and genome-wide association study reveals putative candidate genes associated with resistance to northern corn leaf blight in tropical maize

Northern corn leaf blight (NCLB), caused by Setosphaeria turcica, is a major fungal disease affecting maize production in sub-Saharan Africa. Utilizing host plant resistance to mitigate yield losses associated with NCLB can serve as a cost-effective strategy. In this study, we conducted a high-resol...

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Bibliographic Details

Published in:	Frontiers in Plant Science
Main Authors:	Noel Ndlovu, Manje Gowda, Yoseph Beyene, Biswanath Das, Suresh L. Mahabaleswara, Dan Makumbi, Veronica Ogugo, Juan Burgueno, Jose Crossa, Charles Spillane, Peter C. McKeown, Galina Brychkova, Boddupalli M. Prasanna
Format:	Article
Language:	English
Published:	Frontiers Media S.A. 2024-10-01
Subjects:	northern corn leaf blight (NCLB) genome-wide association study (GWAS) quantitative trait locus (QTL) mapping genomic selection (GS) tropical maize sub-Saharan Africa (SSA)
Online Access:	https://www.frontiersin.org/articles/10.3389/fpls.2024.1448961/full