A Defect-Inspection System Constructed by Applying Autoencoder with Clustered Latent Vectors and Multi-Thresholding Classification
Defect inspection is an important issue in the field of industrial automation. In general, defect-inspection methods can be categorized into supervised and unsupervised methods. When supervised learning is applied to defect inspection, the large variation of defect patterns can make the data coverag...
| 出版年: | Applied Sciences |
|---|---|
| 主要な著者: | , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
MDPI AG
2022-02-01
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| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/2076-3417/12/4/1883 |