APA (7th ed.) Citation

Lien, C., & Chiu, Y. (2022, February). A Defect-Inspection System Constructed by Applying Autoencoder with Clustered Latent Vectors and Multi-Thresholding Classification. Applied Sciences.

Chicago Style (17th ed.) Citation

Lien, Cheng-Chang, and Yu-De Chiu. "A Defect-Inspection System Constructed by Applying Autoencoder with Clustered Latent Vectors and Multi-Thresholding Classification." Applied Sciences Feb. 2022.

MLA (9th ed.) Citation

Lien, Cheng-Chang, and Yu-De Chiu. "A Defect-Inspection System Constructed by Applying Autoencoder with Clustered Latent Vectors and Multi-Thresholding Classification." Applied Sciences, Feb. 2022.