Development of a lifetime evaluation system and lifetime prediction method for GaN RF semiconductors used in manned and unmanned weapon systems

The aim of this study is to develop a testing system that applies RF (Radio Frequency) stress to predict the lifespan of GaN RF semiconductors, a subject of numerous ongoing domestication studies. Additionally, the study proposes an approach that considers the complex effects of degradation mechani...

Full description

Bibliographic Details

Published in:	선진국방연구
Main Authors:	Youngrack Choi, Yunho Kang, Hyounggook Kim
Format:	Article
Language:	English
Published:	Institute of Defense Acquisition Program 2023-09-01
Subjects:	GaN semiconductor reliability lifetime estimation degradation mechanism accelerated life test
Online Access:	https://150.95.154.243/index.php/JAMS/article/view/208