APA(7版)引用形式

Chen, K., Cheng, C., Kao, M., Kao, Y., & Lin, S. (2024, September). Study of the Characteristics of Ba<sub>0.6</sub>Sr<sub>0.4</sub>Ti<sub>1-x</sub>Mn<sub>x</sub>O<sub>3</sub>-Film Resistance Random Access Memory Devices. Micromachines.

Chicagoスタイル(17版)引用形式

Chen, Kai-Huang, Chien-Min Cheng, Ming-Cheng Kao, Yun-Han Kao, , Shen-Feng Lin. "Study of the Characteristics of Ba0.6Sr0.4Ti1-xMnxO3-Film Resistance Random Access Memory Devices." Micromachines Sep. 2024.

MLA(9版)引用形式

Chen, Kai-Huang, et al. "Study of the Characteristics of Ba0.6Sr0.4Ti1-xMnxO3-Film Resistance Random Access Memory Devices." Micromachines, Sep. 2024.

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