Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging

In this study, we used rapid terahertz (THz) time-of-flight (ToF) imaging to identify counterfeit electronics prevalent in the online market. THz-ToF allows the nondestructive reflection imaging of portable electronic devices enclosed by plastic cases with a spatial resolution of 1 mm and a depth ra...

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Bibliographic Details

Published in:	Sensors
Main Authors:	Hyeonseung Ryu, Byung Hee Son, Jihwan Kim, Jangsun Kim, Yeong Hwan Ahn
Format:	Article
Language:	English
Published:	MDPI AG 2025-08-01
Subjects:	terahertz imaging authentication nondestructive testing time-of-flight
Online Access:	https://www.mdpi.com/1424-8220/25/16/5160