Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO

Currently, some intelligent devices are available to assist in the detection of imperfect wheat grains. However, the background of grain surface images acquired by intelligent devices is dense and complicated with overlapping particles, causing noise interferences in the detection of imperfect wheat...

詳細記述

書誌詳細

出版年:	Shipin Kexue
第一著者:	FAN Jiawei, WU Lan, YAN Jingjing
フォーマット:	論文
言語:	英語
出版事項:	China Food Publishing Company 2024-12-01
主題:	real-time detection; imperfect wheat grains; small target detection; grain storage quality; deep learning
オンライン･アクセス:	https://www.spkx.net.cn/fileup/1002-6630/PDF/2024-45-23-030.pdf