A near‐DC measurement and modelling of low‐frequency noise in electronic components

Abstract Low‐frequency noise, generated inherently by the number or mobility fluctuation of carriers, is a crucial concern for the design of analog and digital circuits. Unified modelling based on experimental validation of near‐DC noise in amplifiers is a long‐standing open problem. This article de...

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Bibliographic Details
Published in:IET Science, Measurement & Technology
Main Authors: Zeinab Shamaee, Mohsen Mivehchy, Iraj Kazemi
Format: Article
Language:English
Published: Wiley 2023-11-01
Subjects:
amplifiers
analogue circuits
measurement systems
mixture models
phase noise
spectral analysis
Online Access:https://doi.org/10.1049/smt2.12156

Internet

https://doi.org/10.1049/smt2.12156

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