Electrolytic capacitor surface defect detection based on deep convolution neural network

The existing methods for detecting surface defects in electrolytic capacitors are typically based on conventional machine vision, with limited feature extraction capabilities, poor versatility, slow detection speed, and the inability to achieve accurate and real-time defect detection. In this study,...

詳細記述

書誌詳細
出版年:Journal of King Saud University: Computer and Information Sciences
主要な著者: Haijian Wang, Han Mo, Shilin Lu, Xuemei Zhao
フォーマット: 論文
言語:英語
出版事項: Springer 2024-02-01
主題:
オンライン・アクセス:http://www.sciencedirect.com/science/article/pii/S1319157824000247