Showing 21 - 26 results of 26 for search 'James Chung', query time: 0.06s Refine Results
  1. 21
    Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
    by Dao, Steve Gia, 1973-
    Published 2009
    Other Authors: “...James Chung....”
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  2. 22
    Analysis of hot-carrier AC lifetime model for MOSFET
    by Menberu, Beniyam
    Published 2007
    Other Authors: “...James Chung....”
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  3. 23
    Framework for characterization of copper interconnect in damascene CMP processes
    by Park, Tae Hong, 1973-
    Published 2009
    Other Authors: “...Duane Boning and James Chung....”
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  4. 24
    Using statistical metrology to understand pattern-dependent ILD thickness variation in oxide CMP processes
    by Divecha, Rajesh Ramji
    Published 2008
    Other Authors: “...Duane Boning, James Chung....”
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  5. 25
    A statistical metrology framework for characterizing ILD thickness variation in CMP processes
    by Chang, Eric Choong-Yin
    Published 2008
    Other Authors: “...James Chung, Duane Boning....”
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  6. 26
    Characterization and modeling of uniformity in chemical mechanical polishing
    Other Authors: “...Duane Boning and James Chung....”
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