An Analytical Model of HBM Current Distribution and Its Application on ESD Protection for Sub-Quarter Micron Technology Development

by JIAW-REN SHIH, 施教仁
Published 2000

An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

by Yun-Feng Kao, Jiaw-Ren Shih, Chrong Jung Lin, Ya-Chin King
Published 2021-07-01

Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology

by Chien-Ping Wang, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin, Ya-Chin King
Published 2021-05-01