Showing 121 - 140 results of 180 for search 'Li, Chong', query time: 0.26s Refine Results
  1. 121
    三種薄膜光電元件:M型分光器,多膜分叉波導光強度調變器及改良全反射型光束偏轉器
    Other Authors: “...Li, Chong-Ren...”
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  2. 122
    具有線性相位偏移特性的平面型電光稜鏡偏折器之研究
    Other Authors: “...Li, Chong-Ren...”
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  3. 123
    矽質PLN-四象限光二極體之設計及製作
    Other Authors: “...Li, Chong-Ren...”
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  4. 124
    Thermal stability of Pd-Ge base ohmic contact with diffusion barriers to N-GaAs
    by HUANG,WEN-CHANG, 黃文昌
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  5. 125
    Ppdfsim: a parallel pattern delay fault simulator
    by HUANG,SHUN-DA, 黃順達
    Published 1990
    Other Authors: “...LI,CHONG-REN...”
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  6. 126
    Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits
    by CHEN,WEN-BIN, 陳文斌
    Published 1990
    Other Authors: “...LI,CHONG-REN...”
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  7. 127
    Fault testing in multivalued logic
    by WANG,HUI-MIN, 王慧民
    Published 1990
    Other Authors: “...LI,CHONG-REN...”
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  8. 128
    Fault simulation for delay faults
    by CAI,HUI-HUANG, 蔡輝煌
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  9. 129
    Ellipsometry measurement on heavily absorptive thin film with multiple sandwiched layers
    by YAN,YING-CI, 顏瑛慈
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  10. 130
    薄絕緣閘層場效電晶體特性之研究
    by FANG,HUI-JIA, 方惠加
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  11. 131
    A synthesis system for testable sequential circuits
    by WU,WEI-XIU, 吳維修
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  12. 132
    A test generation system for sequential circuits
    by LIANG,XIN-CONG, 梁新聰
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  13. 133
    A hierarchical test pattern generator
    by YANG,JING-XIANG, 楊景翔
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  14. 134
    Study of the characteristics of the thermal oxides grown on singlecrystalline and polycrystalline silicon
    by CHEN,JUN-YUAN, 陳俊元
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  15. 135
    Ultra-shallow junction in silicon using amorphous, polycrystalline silicon and titanium silicide as solid diffusion sources
    by LIAO,ZHONG-ZHI, 廖忠志
    Published 1991
    Other Authors: “...LI,CHONG-REN...”
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  16. 136
    Hierarchical test pattern generation
    by WANG,LING-LING, 王玲玲
    Published 1990
    Other Authors: “...LI,CHONG-REN...”
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  17. 137
    Testability measure for delay fault in digital circuits
    by WU,WEN-QING, 吳文慶
    Published 1990
    Other Authors: “...LI,CHONG-REN...”
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  18. 138
    A functional level testability measure
    by Huang, Yun-Xi, 黃允熙
    Published 1991
    Other Authors: “...Li, Chong-Ren...”
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  19. 139
    台北地區懸浮微粒濃度與氣象因子關係之研究
    by LIN,BIN-LONG, 林斌龍
    Published 1990
    Other Authors: “...LI,CHONG-DE...”
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  20. 140
    結球微塵粒在蠕動流中鍵結角度及鏈長度對動力形狀因子的影響
    by PAN,JIAN-CHENG, 潘建成
    Published 1990
    Other Authors: “...LI,CHONG-DE...”
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