Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

by Owoong Kwon, Daehee Seol, Huimin Qiao, Yunseok Kim
Published 2020-09-01

Author Correction: Direct growth of orthorhombic Hf0.5Zr0.5O2 thin films for hysteresis-free MoS2 negative capacitance field-effect transistors

by Hae Won Cho, Pavan Pujar, Minsu Choi, Seunghun Kang, Seongin Hong, Junwoo Park, Seungho Baek, Yunseok Kim, Jaichan Lee, Sunkook Kim
Published 2021-05-01

Direct growth of orthorhombic Hf0.5Zr0.5O2 thin films for hysteresis-free MoS2 negative capacitance field-effect transistors

by Hae Won Cho, Pavan Pujar, Minsu Choi, Seunghun Kang, Seongin Hong, Junwoo Park, Seungho Baek, Yunseok Kim, Jaichan Lee, Sunkook Kim
Published 2021-04-01

Non-conventional mechanism of ferroelectric fatigue via cation migration

by Anton V. Ievlev, Santosh KC, Rama K. Vasudevan, Yunseok Kim, Xiaoli Lu, Marin Alexe, Valentino R. Cooper, Sergei V. Kalinin, Olga S. Ovchinnikova
Published 2019-07-01