Showing 1 - 9 results of 9 for search 'Jone F. Chen', query time: 0.12s Refine Results
  1. 1
    Analysis on Reliability for FinFET with Different Processes
    by Yu-HsuanLee, 李佑軒
    Published 2018
    Other Authors: “...Jone F. Chen...”
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  2. 2
    Patent Description Writing Mode Research of Patent Application -A Case Study of Utility Patent Description
    by Kuo-Hsien Huang, 黃國賢
    Published 2003
    Other Authors: “...Jone F. Chen...”
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  3. 3
    Studies on Hot-Carrier Reliability in High-Voltage MOSFETs
    by Jia-Rui Lee, 李佳叡
    Published 2008
    Other Authors: “...Jone F. Chen...”
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  4. 4
    Hot Carrier Effect Induced Degradation in MOSFET’s
    by Chiou-Tian Ho, 何秋田
    Published 2001
    Other Authors: “...Jone F. Chen...”
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  5. 5
    Phenomena and Mechanisms of Hot-Carrier-Induced Degradation in Integrated High-Voltage MOS Devices
    by Shiang-Yu Chen, 陳翔裕
    Published 2009
    Other Authors: “...Jone F. Chen...”
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  6. 6
    Investigation of Hot-Carrier-Induced Degradation in Lateral Diffused MOS Transistors
    by Kuen-Shiuan Tian, 田昆玄
    Published 2009
    Other Authors: “...Jone F. Chen...”
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  7. 7
    Hot-Carrier reliability in deep submicron CMOS device
    by Chih-Pin Tsao, 曹志彬
    Published 2002
    Other Authors: “...Jone F. Chen...”
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  8. 8
    Effects of Device Dimension on Characteristics and Reliability of Peripheral Devices in NAND Flash Memory
    by Chun-PaoChuang, 莊竣堡
    Published 2014
    Other Authors: “...Jone F. Chen...”
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  9. 9
    Effects of Lightly Doped Drain Doping Concentration on Characteristic and Reliability of High Voltage MOS Transistors
    by Wei-HungTsai, 蔡瑋鴻
    Published 2016
    Other Authors: “...Jone F. Chen...”
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