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Mercer, M. Ray
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Mercer, M. Ray
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Mercer, M. Ray
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1
Using ordered partial decision diagrams for manufacture test generation
by
Cobb, Bradley Douglas
Published 2004
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Mercer
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M
.
Ray
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2
Defect site prediction based upon statistical analysis of fault signatures
by
Trinka, Michael Robert
Published 2004
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Mercer
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M
.
Ray
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3
Approaches to test set generation using binary decision diagrams
by
Wingfield, James
Published 2004
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Mercer
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M
.
Ray
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4
Estimating the expected latency to failure due to manufacturing defects
by
Dorsey, David Michael
Published 2004
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Mercer
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M
.
Ray
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5
Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance
by
Dworak, Jennifer Lynn
Published 2004
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Mercer
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M
.
Ray
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