Two-Stage Checkpoint Based Security Monitoring and Fault Recovery Architecture for Embedded Processor

Nowadays, the secure program execution of embedded processor has attracted considerable research attention, since more and more code tampering attacks and transient faults are seriously affecting the security of embedded processors. The program monitoring and fault recovery strategies are not only c...

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Bibliographic Details
Main Authors: Xiang Wang, Zongmin Zhao, Dongdong Xu, Zhun Zhang, Qiang Hao, Mengchen Liu, Yu Si
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/9/7/1165
Description
Summary:Nowadays, the secure program execution of embedded processor has attracted considerable research attention, since more and more code tampering attacks and transient faults are seriously affecting the security of embedded processors. The program monitoring and fault recovery strategies are not only closely related to the security of embedded devices, but also directly affect the performance of the processor. This paper presents a security monitoring and fault recovery architecture for run-time program execution, which takes regular backup copies of the two-stage checkpoint. In this framework, the integrity check technology based on the basic block (BB) is utilized to monitor the program execution in real-time, while the rollback operation is taken once the integrity check is failed. In addition, a Monitoring Cache (M-Cache) is built to buffer the reference data for integrity checking. Moreover, a recovery strategy mainly for three tampered positions (registers in processor, instructions in Cache, and codes in memory) is provided to ensure the smooth running of the embedded system. Finally, the open RISC processor is adopted to implement and verify the presented security architecture, which has been proved to be effective for program detection in the execution of tamper attack and quick recovery of the running environment as well as code.
ISSN:2079-9292