Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams

This work explores a new technique for the out-of-plane patterning of metal thin films prefabricated on the surface of a polymer substrate. This technique is based on an ion-beam-induced material modification in the bulk of the polymer. Effects of subsurface and surface processes on the surface morp...

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Main Authors: Serguei Chiriaev, Luciana Tavares, Vadzim Adashkevich, Arkadiusz J. Goszczak, Horst-Günter Rubahn
Format: Article
Language:English
Published: Beilstein-Institut 2020-11-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.11.151
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spelling doaj-03e3968fa46b491c8c049da5ac6d62c52021-01-04T09:34:36ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862020-11-011111693170310.3762/bjnano.11.1512190-4286-11-151Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beamsSerguei Chiriaev0Luciana Tavares1Vadzim Adashkevich2Arkadiusz J. Goszczak3Horst-Günter Rubahn4NanoSYD, Mads Clausen Institute, University of Southern Denmark, Alsion 2, Sønderborg, 6400, DenmarkNanoSYD, Mads Clausen Institute, University of Southern Denmark, Alsion 2, Sønderborg, 6400, DenmarkCentre for Industrial Electronics, Department of mechanical and electronic engineering, University of Southern Denmark, Alsion 2, Sønderborg, 6400, DenmarkNanoSYD, Mads Clausen Institute, University of Southern Denmark, Alsion 2, Sønderborg, 6400, DenmarkNanoSYD, Mads Clausen Institute, University of Southern Denmark, Alsion 2, Sønderborg, 6400, DenmarkThis work explores a new technique for the out-of-plane patterning of metal thin films prefabricated on the surface of a polymer substrate. This technique is based on an ion-beam-induced material modification in the bulk of the polymer. Effects of subsurface and surface processes on the surface morphology have been studied for three polymer materials: poly(methyl methacrylate), polycarbonate, and polydimethylsiloxane, by using focused ion beam irradiation with He+, Ne+, and Ga+. Thin films of a Pt60Pd40 alloy and of pristine Au were used to compare the patterning of thin films with different microstructures. We show that the height of Pt60Pd40 thin films deposited onto poly(methyl methacrylate) and polycarbonate substrates can be patterned by He+ ion beams with ultrahigh precision (nanometers) while preserving in-plane features, at the nanoscale, of the pre-deposited films. Ion irradiation of the Au-coated samples results in delamination, bulging, and perforation of the Au film, which is attributed to the accumulation of gases from radiolysis at the film–substrate interface. The irradiation with Ne+ and Ga+ ions destroys the films and roughens the surface due to dominating sputtering processes. A very different behavior, resulting in the formation of complex, multiscale 3D patterns, is observed for polydimethylsiloxane samples. The roles of the metal film structure, elastic properties of the polymer substrate, and irradiation-induced mechanical strain in the patterning process are elaborated and discussed.https://doi.org/10.3762/bjnano.11.151direct patterningfocused helium ion beamout-of-plane nanopatterningpolymersthin films
collection DOAJ
language English
format Article
sources DOAJ
author Serguei Chiriaev
Luciana Tavares
Vadzim Adashkevich
Arkadiusz J. Goszczak
Horst-Günter Rubahn
spellingShingle Serguei Chiriaev
Luciana Tavares
Vadzim Adashkevich
Arkadiusz J. Goszczak
Horst-Günter Rubahn
Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
Beilstein Journal of Nanotechnology
direct patterning
focused helium ion beam
out-of-plane nanopatterning
polymers
thin films
author_facet Serguei Chiriaev
Luciana Tavares
Vadzim Adashkevich
Arkadiusz J. Goszczak
Horst-Günter Rubahn
author_sort Serguei Chiriaev
title Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
title_short Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
title_full Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
title_fullStr Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
title_full_unstemmed Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
title_sort out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams
publisher Beilstein-Institut
series Beilstein Journal of Nanotechnology
issn 2190-4286
publishDate 2020-11-01
description This work explores a new technique for the out-of-plane patterning of metal thin films prefabricated on the surface of a polymer substrate. This technique is based on an ion-beam-induced material modification in the bulk of the polymer. Effects of subsurface and surface processes on the surface morphology have been studied for three polymer materials: poly(methyl methacrylate), polycarbonate, and polydimethylsiloxane, by using focused ion beam irradiation with He+, Ne+, and Ga+. Thin films of a Pt60Pd40 alloy and of pristine Au were used to compare the patterning of thin films with different microstructures. We show that the height of Pt60Pd40 thin films deposited onto poly(methyl methacrylate) and polycarbonate substrates can be patterned by He+ ion beams with ultrahigh precision (nanometers) while preserving in-plane features, at the nanoscale, of the pre-deposited films. Ion irradiation of the Au-coated samples results in delamination, bulging, and perforation of the Au film, which is attributed to the accumulation of gases from radiolysis at the film–substrate interface. The irradiation with Ne+ and Ga+ ions destroys the films and roughens the surface due to dominating sputtering processes. A very different behavior, resulting in the formation of complex, multiscale 3D patterns, is observed for polydimethylsiloxane samples. The roles of the metal film structure, elastic properties of the polymer substrate, and irradiation-induced mechanical strain in the patterning process are elaborated and discussed.
topic direct patterning
focused helium ion beam
out-of-plane nanopatterning
polymers
thin films
url https://doi.org/10.3762/bjnano.11.151
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