Preliminary Validation of a Continuum Model for Dimple Patterns on Polyethylene Naphthalate via Ar Ion Beam Sputtering

This work reports the self-organization of dimple nanostructures on a polyethylene naphthalate (PEN) surface where an Ar ion beam was irradiated at an ion energy of 600 eV. The peak-to-peak roughness and diameter of dimple nanostructures were 29.1~53.4 nm and 63.4~77.6 nm, respectively. The electron...

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Bibliographic Details
Main Authors: Jun-Yeong Yang, Sunghoon Jung, Eun-Yeon Byeon, Hyun Hwi Lee, Do-Geun Kim, Hyo Jung Kim, Ho Won Jang, Seunghun Lee
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Polymers
Subjects:
Online Access:https://www.mdpi.com/2073-4360/13/12/1932