| Summary: | In this paper, three dual notch microwave sensors are presented based on a microstrip transmission line and complementary metamaterial resonators. The main aim of this paper is to compare the constitutive parameters and sensitivity of all three dual notch sensors which are based on complementary symmetric split ring resonator (CS-SRR), complementary asymmetric split ring resonator (CAS-SRR) and complementary bisymmetric split ring resonator (CBS-SRR). The main motivation beyond the presented work is to use dual notches to estimate the relative permittivity of material under test (MUT). Electromagnetic simulation elucidates the origin of dual mode resonance of all the three resonators. Sensitivity analysis is performed on each sensor by using fifteen MUTs with relative permittivity ranges from 1.006 to 16.5 and constant dimensions 10 mm × 10 mm × 1 mm. To verify the concept, a sensor is fabricated and its response is measured using a vector network analyzer (AV3672). Using curve fitting technique the shift in the resonance frequencies of the fabricated sensor due to interaction with MUT is presented as a function of permittivity. Simulated, measured and formulated results are in good agreement with each other.
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