Growth model and structure evolution of Ag layers deposited on Ge films
We investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a function 2–10 nm thick Ge wetting films deposited on SiO2 substrates. X-ray reflectometry (XRR) and X-ray diffraction (XRD) measurements proved that segregation of germanium into the surface of the s...
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doaj-0aa0c646689f4ce78e280969de60cce22020-11-24T22:08:17ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862018-01-0191667610.3762/bjnano.9.92190-4286-9-9Growth model and structure evolution of Ag layers deposited on Ge filmsArkadiusz Ciesielski0Lukasz Skowronski1Ewa Górecka2Jakub Kierdaszuk3Tomasz Szoplik4University of Warsaw, Faculty of Physics, Pasteura 5 str., 02-093 Warsaw, PolandUTP University of Science and Technology, Institute of Mathematics and Physics, Kaliskiego 7 Str. 85-796 Bydgoszcz, PolandUniversity of Warsaw, Department of Chemistry, Pasteura 1 str., 02-093 Warsaw, PolandUniversity of Warsaw, Faculty of Physics, Pasteura 5 str., 02-093 Warsaw, PolandUniversity of Warsaw, Faculty of Physics, Pasteura 5 str., 02-093 Warsaw, PolandWe investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a function 2–10 nm thick Ge wetting films deposited on SiO2 substrates. X-ray reflectometry (XRR) and X-ray diffraction (XRD) measurements proved that segregation of germanium into the surface of the silver film is a result of the gradient growth of silver crystals. The free energy of Ge atoms is reduced by their migration from boundaries of larger grains at the Ag/SiO2 interface to boundaries of smaller grains near the Ag surface. Annealing at different temperatures and various durations allowed for a controlled distribution of crystal dimensions, thus influencing the segregation rate. Furthermore, using ellipsometric and optical transmission measurements we determined the time-dependent evolution of the film structure. If stored under ambient conditions for the first week after deposition, the changes in the transmission spectra are smaller than the measurement accuracy. Over the course of the following three weeks, the segregation-induced effects result in considerably modified transmission spectra. Two months after deposition, the slope of the silver layer density profile derived from the XRR spectra was found to be inverted due to the completed segregation process, and the optical transmission spectra increased uniformly due to the roughened surfaces, corrosion of silver and ongoing recrystallization. The Raman spectra of the Ge wetted Ag films were measured immediately after deposition and ten days later and demonstrated that the Ge atoms at the Ag grain boundaries form clusters of a few atoms where the Ge–Ge bonds are still present.https://doi.org/10.3762/bjnano.9.9germaniumsegregationself-assemblysilverthin films |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Arkadiusz Ciesielski Lukasz Skowronski Ewa Górecka Jakub Kierdaszuk Tomasz Szoplik |
spellingShingle |
Arkadiusz Ciesielski Lukasz Skowronski Ewa Górecka Jakub Kierdaszuk Tomasz Szoplik Growth model and structure evolution of Ag layers deposited on Ge films Beilstein Journal of Nanotechnology germanium segregation self-assembly silver thin films |
author_facet |
Arkadiusz Ciesielski Lukasz Skowronski Ewa Górecka Jakub Kierdaszuk Tomasz Szoplik |
author_sort |
Arkadiusz Ciesielski |
title |
Growth model and structure evolution of Ag layers deposited on Ge films |
title_short |
Growth model and structure evolution of Ag layers deposited on Ge films |
title_full |
Growth model and structure evolution of Ag layers deposited on Ge films |
title_fullStr |
Growth model and structure evolution of Ag layers deposited on Ge films |
title_full_unstemmed |
Growth model and structure evolution of Ag layers deposited on Ge films |
title_sort |
growth model and structure evolution of ag layers deposited on ge films |
publisher |
Beilstein-Institut |
series |
Beilstein Journal of Nanotechnology |
issn |
2190-4286 |
publishDate |
2018-01-01 |
description |
We investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a function 2–10 nm thick Ge wetting films deposited on SiO2 substrates. X-ray reflectometry (XRR) and X-ray diffraction (XRD) measurements proved that segregation of germanium into the surface of the silver film is a result of the gradient growth of silver crystals. The free energy of Ge atoms is reduced by their migration from boundaries of larger grains at the Ag/SiO2 interface to boundaries of smaller grains near the Ag surface. Annealing at different temperatures and various durations allowed for a controlled distribution of crystal dimensions, thus influencing the segregation rate. Furthermore, using ellipsometric and optical transmission measurements we determined the time-dependent evolution of the film structure. If stored under ambient conditions for the first week after deposition, the changes in the transmission spectra are smaller than the measurement accuracy. Over the course of the following three weeks, the segregation-induced effects result in considerably modified transmission spectra. Two months after deposition, the slope of the silver layer density profile derived from the XRR spectra was found to be inverted due to the completed segregation process, and the optical transmission spectra increased uniformly due to the roughened surfaces, corrosion of silver and ongoing recrystallization. The Raman spectra of the Ge wetted Ag films were measured immediately after deposition and ten days later and demonstrated that the Ge atoms at the Ag grain boundaries form clusters of a few atoms where the Ge–Ge bonds are still present. |
topic |
germanium segregation self-assembly silver thin films |
url |
https://doi.org/10.3762/bjnano.9.9 |
work_keys_str_mv |
AT arkadiuszciesielski growthmodelandstructureevolutionofaglayersdepositedongefilms AT lukaszskowronski growthmodelandstructureevolutionofaglayersdepositedongefilms AT ewagorecka growthmodelandstructureevolutionofaglayersdepositedongefilms AT jakubkierdaszuk growthmodelandstructureevolutionofaglayersdepositedongefilms AT tomaszszoplik growthmodelandstructureevolutionofaglayersdepositedongefilms |
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1725816870060163072 |