Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range
A tunable bondwire inductor (TBI) with high-quality factor and wide tuning range is presented. The proposed TBI is fabricated on a single chip by combining a single-pole four-throw (SP4T) switch integrated circuit (IC) and four bondwire inductors on a package substrate. The SP4T switch IC is fabrica...
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The Korean Institute of Electromagnetic Engineering and Science
2020-07-01
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doaj-0c978a2b36c34311adc66b47d59b567f2020-11-25T03:51:57ZengThe Korean Institute of Electromagnetic Engineering and ScienceJournal of Electromagnetic Engineering and Science2671-72552671-72632020-07-0120320721210.26866/jees.2020.20.3.2073394Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning RangeYonggoo LeeBomson LeeA tunable bondwire inductor (TBI) with high-quality factor and wide tuning range is presented. The proposed TBI is fabricated on a single chip by combining a single-pole four-throw (SP4T) switch integrated circuit (IC) and four bondwire inductors on a package substrate. The SP4T switch IC is fabricated using 180 nm silicon-on-insulator (SOI) complementary metal-oxide-semiconductor (CMOS) technology. The fabricated TBI chip exhibits a 521% tuning range of inductance from 1.77 to 11 nH at 0.1 GHz and a relatively high-quality factor. To the knowledge of the authors, the results of this work demonstrate the best combined performance of inductance tuning range and quality factor.http://www.jees.kr/upload/pdf/jees-2020-20-3-207.pdfbondwiredigitally-controlledhigh quality factortunable inductorwide tuning range |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Yonggoo Lee Bomson Lee |
spellingShingle |
Yonggoo Lee Bomson Lee Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range Journal of Electromagnetic Engineering and Science bondwire digitally-controlled high quality factor tunable inductor wide tuning range |
author_facet |
Yonggoo Lee Bomson Lee |
author_sort |
Yonggoo Lee |
title |
Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range |
title_short |
Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range |
title_full |
Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range |
title_fullStr |
Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range |
title_full_unstemmed |
Digitally-Controlled Bondwire Inductor with High Quality Factor and Wide Tuning Range |
title_sort |
digitally-controlled bondwire inductor with high quality factor and wide tuning range |
publisher |
The Korean Institute of Electromagnetic Engineering and Science |
series |
Journal of Electromagnetic Engineering and Science |
issn |
2671-7255 2671-7263 |
publishDate |
2020-07-01 |
description |
A tunable bondwire inductor (TBI) with high-quality factor and wide tuning range is presented. The proposed TBI is fabricated on a single chip by combining a single-pole four-throw (SP4T) switch integrated circuit (IC) and four bondwire inductors on a package substrate. The SP4T switch IC is fabricated using 180 nm silicon-on-insulator (SOI) complementary metal-oxide-semiconductor (CMOS) technology. The fabricated TBI chip exhibits a 521% tuning range of inductance from 1.77 to 11 nH at 0.1 GHz and a relatively high-quality factor. To the knowledge of the authors, the results of this work demonstrate the best combined performance of inductance tuning range and quality factor. |
topic |
bondwire digitally-controlled high quality factor tunable inductor wide tuning range |
url |
http://www.jees.kr/upload/pdf/jees-2020-20-3-207.pdf |
work_keys_str_mv |
AT yonggoolee digitallycontrolledbondwireinductorwithhighqualityfactorandwidetuningrange AT bomsonlee digitallycontrolledbondwireinductorwithhighqualityfactorandwidetuningrange |
_version_ |
1724485286308610048 |