Double staining method for array tomography using scanning electron microscopy
Abstract Scanning electron microscopy (SEM) plays a central role in analyzing structures by imaging a large area of brain tissue at nanometer scales. A vast amount of data in the large area are required to study structural changes of cellular organelles in a specific cell, such as neurons, astrocyte...
Main Authors: | Eunjin Kim, Jiyoung Lee, Seulgi Noh, Ohkyung Kwon, Ji Young Mun |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2020-06-01
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Series: | Applied Microscopy |
Subjects: | |
Online Access: | https://doi.org/10.1186/s42649-020-00033-8 |
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