Random walk-based similarity measure method for patterns in complex object

This paper discusses the similarity of the patterns in complex objects. The complex object is composed both of the attribute information of patterns and the relational information between patterns. Bearing in mind the specificity of complex object, a random walk-based similarity measurement method f...

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Bibliographic Details
Main Authors: Liu Shihu, Chen Xiaozhou
Format: Article
Language:English
Published: De Gruyter 2017-04-01
Series:Open Physics
Subjects:
Online Access:https://doi.org/10.1515/phys-2017-0016
Description
Summary:This paper discusses the similarity of the patterns in complex objects. The complex object is composed both of the attribute information of patterns and the relational information between patterns. Bearing in mind the specificity of complex object, a random walk-based similarity measurement method for patterns is constructed. In this method, the reachability of any two patterns with respect to the relational information is fully studied, and in the case of similarity of patterns with respect to the relational information can be calculated. On this bases, an integrated similarity measurement method is proposed, and algorithms 1 and 2 show the performed calculation procedure. One can find that this method makes full use of the attribute information and relational information. Finally, a synthetic example shows that our proposed similarity measurement method is validated.
ISSN:2391-5471