Higher Rate Secret Key Formation (HRKF) based on Physical Layer for Securing Vehicle-to-Vehicle Communication

One effort to secure vehicle-to-vehicle (V2V) communication is to use a symmetrical cryptographic scheme that requires the distribution of shared secret keys. To reduce attacks on key distribution, physical layer-based key formation schemes that utilize the characteristics of wireless channels have...

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Bibliographic Details
Main Authors: Inka Trisna Dewi, Amang Sudarsono, Prima Kristalina, Mike Yuliana
Format: Article
Language:English
Published: Politeknik Elektronika Negeri Surabaya 2020-06-01
Series:Emitter: International Journal of Engineering Technology
Subjects:
RSS
Online Access:https://emitter.pens.ac.id/index.php/emitter/article/view/493
Description
Summary:One effort to secure vehicle-to-vehicle (V2V) communication is to use a symmetrical cryptographic scheme that requires the distribution of shared secret keys. To reduce attacks on key distribution, physical layer-based key formation schemes that utilize the characteristics of wireless channels have been implemented. However, existing schemes still produce a low bit formation rate (BFR) even though they can reach a low bit error rate (BER). Note that V2V communication requires a scheme with high BFR in order to fulfill its main goal of improving road safety. In this research, we propose a higher rate secret key formation (HRKF) scheme using received signal strength (RSS) as a source of random information. The focus of this research is to produce keys with high BFR without compromising BER. To reduce bit mismatch, we propose a polynomial regression method that can increase channel reciprocity. We also propose a fixed threshold quantization (FTQ) method to maintain the number of bits so that the BFR increases. The test results show that the HRKF scheme can increase BFR from 40% up to 100% compared to existing research schemes. To ensure the key cannot be guessed by the attacker, the HRKF scheme succeeds in producing a key that meets the randomness of the NIST test.
ISSN:2355-391X
2443-1168