Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data

• Main Authors: Cihun-Siyong Alex Gong, Yung-Chang Chang, Li-Ren Huang, Chih-Jen Yang, Kung-Ming Ji, Kuen-Long Lu, Jian-Chiun Liou
• Format: Article
• Language: English
• Published: MDPI AG 2018-07-01
• Series: Applied Sciences
• Subjects: memory; protection; ECC; parity; non-volatile; variable length; data integrity; smart sensor
• Online Access: http://www.mdpi.com/2076-3417/8/8/1211

This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.