Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data
This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic r...
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doaj-0fdc923c9bb2439598eeb2be96740bb82020-11-24T21:49:05ZengMDPI AGApplied Sciences2076-34172018-07-0188121110.3390/app8081211app8081211Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart DataCihun-Siyong Alex Gong0Yung-Chang Chang1Li-Ren Huang2Chih-Jen Yang3Kung-Ming Ji4Kuen-Long Lu5Jian-Chiun Liou6Department of Electrical Engineering, College of Engineering, Chang Gung University, Taoyuan 33302, TaiwanInformation and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, TaiwanInformation and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, TaiwanInformation and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, TaiwanInformation and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, TaiwanInformation and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, TaiwanSchool of Biomedical Engineering, College of Biomedical Engineering, Taipei Medical University, Taipei 11031, TaiwanThis paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.http://www.mdpi.com/2076-3417/8/8/1211memoryprotectionECCparitynon-volatilevariable lengthdata integritysmart sensor |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Cihun-Siyong Alex Gong Yung-Chang Chang Li-Ren Huang Chih-Jen Yang Kung-Ming Ji Kuen-Long Lu Jian-Chiun Liou |
spellingShingle |
Cihun-Siyong Alex Gong Yung-Chang Chang Li-Ren Huang Chih-Jen Yang Kung-Ming Ji Kuen-Long Lu Jian-Chiun Liou Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data Applied Sciences memory protection ECC parity non-volatile variable length data integrity smart sensor |
author_facet |
Cihun-Siyong Alex Gong Yung-Chang Chang Li-Ren Huang Chih-Jen Yang Kung-Ming Ji Kuen-Long Lu Jian-Chiun Liou |
author_sort |
Cihun-Siyong Alex Gong |
title |
Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data |
title_short |
Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data |
title_full |
Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data |
title_fullStr |
Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data |
title_full_unstemmed |
Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data |
title_sort |
two dimensional parity check with variable length error detection code for the non-volatile memory of smart data |
publisher |
MDPI AG |
series |
Applied Sciences |
issn |
2076-3417 |
publishDate |
2018-07-01 |
description |
This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation. |
topic |
memory protection ECC parity non-volatile variable length data integrity smart sensor |
url |
http://www.mdpi.com/2076-3417/8/8/1211 |
work_keys_str_mv |
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