Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data
This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic r...
Main Authors: | Cihun-Siyong Alex Gong, Yung-Chang Chang, Li-Ren Huang, Chih-Jen Yang, Kung-Ming Ji, Kuen-Long Lu, Jian-Chiun Liou |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-07-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | http://www.mdpi.com/2076-3417/8/8/1211 |
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