A New Extension of the Binomial Error Model for Responses to Items of Varying Difficulty in Educational Testing and Attitude Surveys.
We put forward a new item response model which is an extension of the binomial error model first introduced by Keats and Lord. Like the binomial error model, the basic latent variable can be interpreted as a probability of responding in a certain way to an arbitrarily specified item. For a set of di...
Main Authors: | James A Wiley, John Levi Martin, Stephen J Herschkorn, Jason Bond |
---|---|
Format: | Article |
Language: | English |
Published: |
Public Library of Science (PLoS)
2015-01-01
|
Series: | PLoS ONE |
Online Access: | http://europepmc.org/articles/PMC4636229?pdf=render |
Similar Items
-
Correction: A New Extension of the Binomial Error Model for Responses to Items of Varying Difficulty in Educational Testing and Attitude Surveys.
by: James A Wiley, et al.
Published: (2015-01-01) -
On Varying Item Difficulty by Changing the Response Format for a Mathematical Competence Test
by: Christine Hohensinn, et al.
Published: (2016-04-01) -
Test difficulty, reliability, and discrimination as functions of item difficulty order /
by: Brenner, Marshall Hallock
Published: (1962) -
Rethinking Vocabulary Size Tests: Frequency Versus Item Difficulty
by: Hashimoto, Brett James
Published: (2016) -
A Comparison of Two Criterion-Referenced Item-Selection Techniques Utilizing Simulated Data with Item Pools that Vary in Degrees of Item Difficulty
by: Davis, Robbie G.
Published: (1974)