Xu, Z., Hu, C., Yang, F., Kuo, S., Goh, C., Gupta, A., & Nadarajan, S. (2017). Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines. IEEE.
Chicago Style (17th ed.) CitationXu, Zhao, Changhua Hu, Feng Yang, Shyh-Hao Kuo, Chi-Keong Goh, Amit Gupta, and Sivakumar Nadarajan. Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines. IEEE, 2017.
MLA (8th ed.) CitationXu, Zhao, et al. Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines. IEEE, 2017.
Warning: These citations may not always be 100% accurate.