A Digital Improvement—Trimming a Digital Temperature Sensor with EEPROM Reprogrammable Fuses

• Main Authors: Anca Mihaela Vasile (Dragan), Alina Negut, Adrian Tache, Gheorghe Brezeanu
• Format: Article
• Language: English
• Published: MDPI AG 2021-03-01
• Series: Sensors
• Subjects: integrated circuits; EEPROM reprogrammable fuses; memory cells; trimming techniques with fuses; digital temperature sensor; temperature sensor with digital serial interface
• Online Access: https://www.mdpi.com/1424-8220/21/5/1700

An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-µm CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes applied to the thermal sensor. By reprogramming the fuse, the temperature sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. Experimental results for the trimmed digital sensor showed a +1.5/−1.0 ℃ inaccuracy in the temperature range of −20 to 125 ℃ for 25 trimmed DTS samples at 1.8 V by one-point calibration. Furthermore, an average mean of 0.40 ℃ and a standard deviation of 0.70 ℃ temperature error were obtained in the same temperature range for power supply voltages from 1.7 to 1.9 V. Thus, the digital sensor exhibits similar performances for the entire power supply range of 1.7 to 3.6 V.