Experimental research of electronic products degradation

Experimental research of electronic products degradation

With the help of accelerated tests we have obtained experimental data about the degradation of the functional parameters of three types of high-power transistors as the representatives of electronic products. Histograms of parameters’ distribution were constructed on the experimental data. It was fo...

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Bibliographic Details
Main Authors: S. M. Borovikov, E. N. Shneiderov, V. I. Plebanovich, A. I. Berasnevich, I. A. Burak
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
electronic product
transistor
reliability
degradation of parameters
accelerated test
Online Access:https://doklady.bsuir.by/jour/article/view/1078

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