Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry
Copper (Cu) and nickel (Ni) nanoparticles have been grown simultaneously on glass and silicon substrates by RF sputtering method to form three Cu/Ni nanocomposites at different deposition times. The existence of Cu and Ni peaks in the X-ray diffraction (XRD) profiles confirms the crystalline structu...
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doaj-1df88beecaa64e4693b02a841098d2942021-09-06T19:22:36ZengSciendoMaterials Science-Poland2083-134X2020-06-0138232833310.2478/msp-2020-0011msp-2020-0011Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometryNikpasand Kimia0Elahi Seyed Mohammad1SarI Amir Hossein2Boochani Arash3Department of Physics, Faculty of Sciences, Science and Research Branch, Islamic Azad University, Tehran, Iran.Department of Physics, Faculty of Sciences, Science and Research Branch, Islamic Azad University, Tehran, Iran.Department of Physics, Faculty of Sciences, Science and Research Branch, Islamic Azad University, Tehran, Iran.Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, IranCopper (Cu) and nickel (Ni) nanoparticles have been grown simultaneously on glass and silicon substrates by RF sputtering method to form three Cu/Ni nanocomposites at different deposition times. The existence of Cu and Ni peaks in the X-ray diffraction (XRD) profiles confirms the crystalline structure of samples with Cu and Ni atomic content which have also been characterized by Rutherford backscattering (RBS) method. Moreover, the structural and morphological properties of the prepared nanocomposites have been compared with respect to their morphologies by means of atomic force microscopy (AFM) analysis. In order to compare the surface roughness over different spatial frequency ranges and evaluate surface quality, power spectral density (PSD) of each sample has been extracted from AFM data and also, the experimental and theoretical results have been compared. The fractal nature of these nanocomposites has been finally discussed.https://doi.org/10.2478/msp-2020-0011cu/ni nanocompositepower spectral densitycrystalline structuresurface micromorphologyatomic force microscopy |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Nikpasand Kimia Elahi Seyed Mohammad SarI Amir Hossein Boochani Arash |
spellingShingle |
Nikpasand Kimia Elahi Seyed Mohammad SarI Amir Hossein Boochani Arash Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry Materials Science-Poland cu/ni nanocomposite power spectral density crystalline structure surface micromorphology atomic force microscopy |
author_facet |
Nikpasand Kimia Elahi Seyed Mohammad SarI Amir Hossein Boochani Arash |
author_sort |
Nikpasand Kimia |
title |
Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry |
title_short |
Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry |
title_full |
Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry |
title_fullStr |
Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry |
title_full_unstemmed |
Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry |
title_sort |
surface micromorphology analysis of cu/ni nanocomposite thin films by power spectra density and fractal geometry |
publisher |
Sciendo |
series |
Materials Science-Poland |
issn |
2083-134X |
publishDate |
2020-06-01 |
description |
Copper (Cu) and nickel (Ni) nanoparticles have been grown simultaneously on glass and silicon substrates by RF sputtering method to form three Cu/Ni nanocomposites at different deposition times. The existence of Cu and Ni peaks in the X-ray diffraction (XRD) profiles confirms the crystalline structure of samples with Cu and Ni atomic content which have also been characterized by Rutherford backscattering (RBS) method. Moreover, the structural and morphological properties of the prepared nanocomposites have been compared with respect to their morphologies by means of atomic force microscopy (AFM) analysis. In order to compare the surface roughness over different spatial frequency ranges and evaluate surface quality, power spectral density (PSD) of each sample has been extracted from AFM data and also, the experimental and theoretical results have been compared. The fractal nature of these nanocomposites has been finally discussed. |
topic |
cu/ni nanocomposite power spectral density crystalline structure surface micromorphology atomic force microscopy |
url |
https://doi.org/10.2478/msp-2020-0011 |
work_keys_str_mv |
AT nikpasandkimia surfacemicromorphologyanalysisofcuninanocompositethinfilmsbypowerspectradensityandfractalgeometry AT elahiseyedmohammad surfacemicromorphologyanalysisofcuninanocompositethinfilmsbypowerspectradensityandfractalgeometry AT sariamirhossein surfacemicromorphologyanalysisofcuninanocompositethinfilmsbypowerspectradensityandfractalgeometry AT boochaniarash surfacemicromorphologyanalysisofcuninanocompositethinfilmsbypowerspectradensityandfractalgeometry |
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