An energy approach to predict electromigration induced grain rotation under high current density
An energy approach is proposed to describe the electromigration induced grain rotation under high current density. The driving force is assumed to arise from the grain-boundary energy reduction and increase of the inner energy from the joule heating. Energy dissipates by the grain boundary diffusion...
Main Authors: | Yuexing Wang, Yao Yao |
---|---|
Format: | Article |
Language: | English |
Published: |
Elsevier
2019-01-01
|
Series: | Theoretical and Applied Mechanics Letters |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2095034919300091 |
Similar Items
-
Grain Rotation Induced by Electromigration in Pure Tin Strip
by: YU-CHUNG HSIEH, et al.
Published: (2009) -
Study of Electromigration in Flip Chip Solder Joints under Extra High Current Density with Temperature Control
by: Yu-Wei Lin, et al.
Published: (2010) -
The In-Situ Observation of Grain Rotation and Microstructure Evolution Induced by Electromigration in Sn-3.0Ag-0.5Cu Solder Joints
by: Xing Fu, et al.
Published: (2020-12-01) -
Electromigration in metals and critical currents in high Tc superconductors
by: Hibbs, Andrew Dennis
Published: (1989) -
Electrical Current Density Effects on IMC Formation and Electromigration of Lead Free Solders
by: Wei-Jhen Chen, et al.
Published: (2017)