Input-Aware Implication Selection Scheme Utilizing ATPG for Efficient Concurrent Error Detection
Recently, concurrent error detection enabled through invariant relationships between different wires in a circuit has been proposed. Because there are many such implications in a circuit, selection strategies have been developed to select the most valuable implications for inclusion in the checker h...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018-10-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9292/7/10/258 |