Assessment of Effects of a Delay Block and a Nonlinear Block in Systems with Chaotic Behavior Using Lyapunov Exponents

Context: Because feedback systems are very common and widely used, studies of the structural characteristics under which chaotic behavior is generated have been developed. These can be separated into a nonlinear system and a linear system at least of the third order. Methods such as the descriptive...

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Bibliographic Details
Main Authors: Pablo César Rodríguez Gómez, Maikoll Andres Rodriguez Nieto, Jose Jairo Soriano Mendez
Format: Article
Language:Spanish
Published: Universidad Distrital Francisco José de Caldas 2017-05-01
Series:Ingeniería
Subjects:
Online Access:http://revistas.udistrital.edu.co/ojs/index.php/reving/article/view/11384
Description
Summary:Context: Because feedback systems are very common and widely used, studies of the structural characteristics under which chaotic behavior is generated have been developed. These can be separated into a nonlinear system and a linear system at least of the third order. Methods such as the descriptive function have been used for analysis. Method: A feedback system is proposed comprising a linear system, a nonlinear system and a delay block, in order to assess his behavior using Lyapunov exponents. It is evaluated with three different linear systems, different delay values and different values for parameters of nonlinear characteristic, aiming to reach chaotic behavior. Results: One hundred experiments were carried out for each of the three linear systems, by changing the value of some parameters, assessing their influence on the dynamics of the system. Contour plots that relate these parameters to the Largest Lyapunov exponent were obtained and analyzed. Conclusions: In spite non-linearity is a condition for the existence of chaos, this does not imply that any nonlinear characteristic generates a chaotic system, it is reflected by the contour plots showing the transitions between chaotic and no chaotic behavior of the feedback system. Language: English
ISSN:0121-750X
2344-8393