ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri

ZnO films were prepared on glass at 3005 C substrate temperature by ultrasonic spray pyrolysis. The deposited films were annealed at various temperatures (350, 450, 550 C) for 2 hours. Annealed and unannealed of ZnO films were characterized by studying their optical, electrical and surface proper...

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Main Authors: Olcay GENÇYILMAZ, Ferhunde ATAY, İdris AKYÜZ
Format: Article
Language:English
Published: Suleyman Demirel University 2014-07-01
Series:Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi
Subjects:
Online Access:http://dergipark.ulakbim.gov.tr/sdufenbed/article/view/1089004609
id doaj-270b1d19d9894c8d869ed2b48bc9f7fb
record_format Article
spelling doaj-270b1d19d9894c8d869ed2b48bc9f7fb2020-11-24T22:02:30ZengSuleyman Demirel UniversitySüleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi1308-65292014-07-0117310.19113/sdufbed.080061089003445ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin EtkileriOlcay GENÇYILMAZFerhunde ATAYİdris AKYÜZZnO films were prepared on glass at 3005 C substrate temperature by ultrasonic spray pyrolysis. The deposited films were annealed at various temperatures (350, 450, 550 C) for 2 hours. Annealed and unannealed of ZnO films were characterized by studying their optical, electrical and surface properties. The optical transmittance and absorbance spectra of all films were examined by UV-VIS Spectrophotometer and the optical band gap was found using optic method. Besides, visible emission peaks and native point defects of ZnO films were determinate using photoluminescence spectra. Thickness, refractive index and extinction coefficient values were obtained with spectroscopic ellipsometry technique. The electrical and surface properties of the films were characterized four point technique and atomic force microscopy, respectively. According to result, the effects of annealing temperature on the optical, electrical and surface properties of the ZnO films are discussedhttp://dergipark.ulakbim.gov.tr/sdufenbed/article/view/1089004609Gövde Isı değiştiricisi Basınç düşümü Enerji
collection DOAJ
language English
format Article
sources DOAJ
author Olcay GENÇYILMAZ
Ferhunde ATAY
İdris AKYÜZ
spellingShingle Olcay GENÇYILMAZ
Ferhunde ATAY
İdris AKYÜZ
ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri
Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi
Gövde Isı değiştiricisi Basınç düşümü Enerji
author_facet Olcay GENÇYILMAZ
Ferhunde ATAY
İdris AKYÜZ
author_sort Olcay GENÇYILMAZ
title ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri
title_short ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri
title_full ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri
title_fullStr ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri
title_full_unstemmed ZnO Filmlerinin Optik, Elektrik ve Yüzey Özellikleri Üzerine Tavlama İşleminin Etkileri
title_sort zno filmlerinin optik, elektrik ve yüzey özellikleri üzerine tavlama i̇şleminin etkileri
publisher Suleyman Demirel University
series Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi
issn 1308-6529
publishDate 2014-07-01
description ZnO films were prepared on glass at 3005 C substrate temperature by ultrasonic spray pyrolysis. The deposited films were annealed at various temperatures (350, 450, 550 C) for 2 hours. Annealed and unannealed of ZnO films were characterized by studying their optical, electrical and surface properties. The optical transmittance and absorbance spectra of all films were examined by UV-VIS Spectrophotometer and the optical band gap was found using optic method. Besides, visible emission peaks and native point defects of ZnO films were determinate using photoluminescence spectra. Thickness, refractive index and extinction coefficient values were obtained with spectroscopic ellipsometry technique. The electrical and surface properties of the films were characterized four point technique and atomic force microscopy, respectively. According to result, the effects of annealing temperature on the optical, electrical and surface properties of the ZnO films are discussed
topic Gövde Isı değiştiricisi Basınç düşümü Enerji
url http://dergipark.ulakbim.gov.tr/sdufenbed/article/view/1089004609
work_keys_str_mv AT olcaygencyilmaz znofilmlerininoptikelektrikveyuzeyozellikleriuzerinetavlamaislemininetkileri
AT ferhundeatay znofilmlerininoptikelektrikveyuzeyozellikleriuzerinetavlamaislemininetkileri
AT idrisakyuz znofilmlerininoptikelektrikveyuzeyozellikleriuzerinetavlamaislemininetkileri
_version_ 1725835480681938944