Plasma-Enhanced Atomic Layer Deposition (PEALD) of TiN using the Organic Precursor Tetrakis(ethylmethylamido)Titanium (TEMAT)
This paper presents the plasma-enhanced atomic layer deposition (PEALD) of titanium nitride (TiN) using the organic precursor tetrakis(ethylmethylamido)titanium (TEMAT), with remote ammonia (NH3) plasma as reactant gas. This work investigates the impact of substrate temperature, from 150-350°C, and...
Main Authors: | Chen Z.X., Li X., Li W.-M., Lo G.-Q. |
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2016-01-01
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Series: | MATEC Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/matecconf/20163901010 |
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