Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering
The comparison of traditional fractal anti-counterfeit labels is based mainly on manual inspection. However, such labels have rich details and complex structures, making the entire identification process labor-intensive. Thus, manual inspections are highly susceptible to low identification accuracy,...
Main Authors: | Wen Wang, Guoyong Han, Guanglei Sun |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9146652/ |
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