Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu

Highly (111)-oriented Cu pillar-bumps were bonded to highly (111)-oriented Cu films at temperatures ranging from 200 &#176;C/100 &#176;C to 350 &#176;C/100 &#176;C in N<sub>2</sub> ambient conditions. The microstructures of the bonded interfaces affected the shear strengt...

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Main Authors: Jing-Ye Juang, Chia-Ling Lu, Yu-Jin Li, K. N. Tu, Chih Chen
Format: Article
Language:English
Published: MDPI AG 2018-11-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/11/12/2368
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spelling doaj-323747d401b044098dd05e1dfc8db45b2020-11-24T23:58:06ZengMDPI AGMaterials1996-19442018-11-011112236810.3390/ma11122368ma11122368Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned CuJing-Ye Juang0Chia-Ling Lu1Yu-Jin Li2K. N. Tu3Chih Chen4Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, TaiwanDepartment of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, TaiwanDepartment of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, TaiwanDepartment of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, TaiwanDepartment of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, TaiwanHighly (111)-oriented Cu pillar-bumps were bonded to highly (111)-oriented Cu films at temperatures ranging from 200 &#176;C/100 &#176;C to 350 &#176;C/100 &#176;C in N<sub>2</sub> ambient conditions. The microstructures of the bonded interfaces affected the shear strength performance of the bonded Cu joints. The bonded interfaces at 300 &#176;C/100 &#176;C and 350 &#176;C/100 &#176;C had far fewer voids than interfaces bonded at 200 &#176;C/100 &#176;C and 250 &#176;C/100 &#176;C. In addition, grain growth took place across the bonding interfaces at temperatures above 300 &#176;C/100 &#176;C. The corresponding orientation map (OIM) showed the preferred orientation of large grown grains to be &lt;100&gt;. Shear tests revealed that the fracture mode was brittle for joints bonded at 200 &#176;C/100 &#176;C, but became ductile after bonded above 300 &#176;C/100 &#176;C. Based on the results, we found that voids and grain growth behavior play import roles in the shear strength performance of bonded Cu joints.https://www.mdpi.com/1996-1944/11/12/2368Cu-to-Cu direct bondingnanotwinned Cusurface diffusiongrain growthshear strength
collection DOAJ
language English
format Article
sources DOAJ
author Jing-Ye Juang
Chia-Ling Lu
Yu-Jin Li
K. N. Tu
Chih Chen
spellingShingle Jing-Ye Juang
Chia-Ling Lu
Yu-Jin Li
K. N. Tu
Chih Chen
Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu
Materials
Cu-to-Cu direct bonding
nanotwinned Cu
surface diffusion
grain growth
shear strength
author_facet Jing-Ye Juang
Chia-Ling Lu
Yu-Jin Li
K. N. Tu
Chih Chen
author_sort Jing-Ye Juang
title Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu
title_short Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu
title_full Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu
title_fullStr Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu
title_full_unstemmed Correlation between the Microstructures of Bonding Interfaces and the Shear Strength of Cu-to-Cu Joints Using (111)-Oriented and Nanotwinned Cu
title_sort correlation between the microstructures of bonding interfaces and the shear strength of cu-to-cu joints using (111)-oriented and nanotwinned cu
publisher MDPI AG
series Materials
issn 1996-1944
publishDate 2018-11-01
description Highly (111)-oriented Cu pillar-bumps were bonded to highly (111)-oriented Cu films at temperatures ranging from 200 &#176;C/100 &#176;C to 350 &#176;C/100 &#176;C in N<sub>2</sub> ambient conditions. The microstructures of the bonded interfaces affected the shear strength performance of the bonded Cu joints. The bonded interfaces at 300 &#176;C/100 &#176;C and 350 &#176;C/100 &#176;C had far fewer voids than interfaces bonded at 200 &#176;C/100 &#176;C and 250 &#176;C/100 &#176;C. In addition, grain growth took place across the bonding interfaces at temperatures above 300 &#176;C/100 &#176;C. The corresponding orientation map (OIM) showed the preferred orientation of large grown grains to be &lt;100&gt;. Shear tests revealed that the fracture mode was brittle for joints bonded at 200 &#176;C/100 &#176;C, but became ductile after bonded above 300 &#176;C/100 &#176;C. Based on the results, we found that voids and grain growth behavior play import roles in the shear strength performance of bonded Cu joints.
topic Cu-to-Cu direct bonding
nanotwinned Cu
surface diffusion
grain growth
shear strength
url https://www.mdpi.com/1996-1944/11/12/2368
work_keys_str_mv AT jingyejuang correlationbetweenthemicrostructuresofbondinginterfacesandtheshearstrengthofcutocujointsusing111orientedandnanotwinnedcu
AT chialinglu correlationbetweenthemicrostructuresofbondinginterfacesandtheshearstrengthofcutocujointsusing111orientedandnanotwinnedcu
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AT chihchen correlationbetweenthemicrostructuresofbondinginterfacesandtheshearstrengthofcutocujointsusing111orientedandnanotwinnedcu
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