IDENTIFICATION OF SENSITIVITY FACTORS OF IC OUTPUT PARAMETERS TO INTERNAL DEFECTS
The crucial problem of ensuring operational reliability of modern radio electronic equipment is the problem of detecting the integrated circuits with latent (not obvious) defects in the course of production. Such defects shall not be revealed through standard checking procedures specified in standar...
| Main Authors: | , |
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| Format: | Article |
| Language: | Russian |
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Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/105 |